The aim of the DTIS international conference is to cope with the rapidly progressing electronic technology which is today reaching the nanometer scale.
The main area of interest deals with the design, technology and test of electronic products, ranging from integrated circuits through multi-chip modules and printed circuit board to full systems and Microsystems, as well as examining the methodologies and tools used in the design and fabrication of such rapidly growing products.
The official language of the DTIS international conference is English.
1st International Conference on Design & Test of Integrated Systems in nanoscale technology |
5-7 September 2006
Gammarth, Tunisia |
Participation rate
- 114 papers submitted
- 49 oral presentations distributed in two parallel tracks (43%)
- 27 poster presentations distributed in 4 poster sessions (23%)
Conference statistics |
Participants country |
number |
USA |
2 |
Algeria |
1 |
Belgium |
1 |
Egypt |
3 |
France |
32 |
Greece |
1 |
India |
1 |
Iran |
2 |
Japan |
2 |
Netherlands |
2 |
Portugal |
1 |
Spain |
5 |
Sweden |
1 |
Tunisia |
29 |
Total |
83 |
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Copies may be ordered from:
Mohamed Masmoudi
National Engineering School of Sfax (ENIS)
BP W , 3038 Sfax, Tunisia
+216 74274088 (phone)
+216 74677657 (fax)
mohamed.masmoudi@enis.rnu.tn (e-mail)
DTIS’06 Keynotes
.: Automated Design of Microfluidics-Based Biochips: Connecting Biochemistry to Electronics CAD, which will be given by Dr. Krishnendu Chakrabarty from Duke University, USA. (Abstract)
.: SiP Technologies: Perspectives and Challenges, which will be given by Dr. Philippe Cauvet from Philips, France. (
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